Ethernet Development Tools 3-Port Fast Ethernet Switch with 1x MII Interface - Evaluation Board

Ethernet Development Tools 3-Port Fast Ethernet Switch with 1x MII Interface - Evaluation Board

TPS23756EVM: Evaluation Module for TPS23756

The AD5337?/?AD5338?/ AD5339 are dual 8-, 10-, and 12-bit buffered voltage output DACs, respectively. Each part is housed in an 8-lead MSOP package and operates from a single 2.5 V to 5.5 V supply, consuming 250 ?A at 3 V. On-chip output amplifiers allow rail-to-rail output swing with a slew rate of 0.7 V/?s. A 2-wire serial interface operates at clock rates up to 400 kHz. This interface is SMBus compatible at VDD < 3.6 V. Multiple devices can be placed on the same bus.The references for the two DACs are derived from one reference pin. The outputs of all DACs can be updated simultaneously using the software LDAC function. The parts incorporate a power-on reset circuit to ensure that the DAC outputs power up to 0 V and remain there until a valid write to the device takes place. A software clear function resets all input and DAC registers to 0 V. A power-down feature reduces the current consumption of the devices to 200 nA @ 5 V (80 nA @ 3 V).The low power consumption of these parts in normal operation makes them ideally suited to portable battery-operated equipment. The power consumption is typically 1.5 mW at 5 V and 0.75 mW at 3 V, reducing to 1 ?W in power-down mode.APPLICATIONS Portable battery-powered instruments Digital gain and offset adjustment Programmable voltage and current sources Programmable attenuators Industrial process control

DC511A: Demo Board for the LT3439 Slew Rate Controlled Ultralow Noise 1A Isolated DC/DC Transformer Driver.

MSP-TS430RGZ48C - 48-pin Target Development Board for MSP430FRxx FRAM MCUs

DC610A Demo Board for: LTC1693 High Speed Single/Dual N-Channel MOSFET Drivers LT3804 Secondary Side Dual Output Controller with Opto Driver LT3781 Bootstrap Start Dual Transistor Synchronous Forward Controller

USB to RS232 Development/Evaluation Board for the FT232R

The ADATE324 is a complete, single-chip, quad-channel automatic test equipment (ATE) solution that performs the pin electronics (PE) functions of a driver, a comparator, and an active load (DCL). The device also features a high voltage (VHH) drive capability per chip to support flash memory testing applications. Dedicated 16-bit digital-to-analog converters (DACs) with on-chip calibration registers provide all the necessary dc levels for operation of the device.The voltage driver features three active states: high, low, and terminate mode, as well as a high impedance inhibit state. The inhibit state, in conjunction with the integrated dynamic clamps, facilitates significant attenuation of transmission line reflections when the driver is not actively terminating the line. The open circuit drive capability is ?1.5 V to +4.5 V to accommodate the standard range of ATE and instrumentation applications.The ADATE324 can be used as a quad, single-ended, pin electronics channel or as a dual differential channel. In additional to per channel, high speed window comparators, the ADATE324 provides two programmable threshold differential comparators for differential ATE applications.All dc levels for DCL functions are generated by dedicated on-chip 16-bit DACs. To facilitate accurate programming levels, the ADATE324 also includes an integrated calibration function to correct for gain and offset errors of each functional block. Correction coefficients can be stored on chip, and any values written to the DACs are automatically adjusted using the appropriate correction factors.The ADATE324 uses a serial programmable interface (SPI) bus to program all functional blocks, DACs, and on-chip calibration constants. The device also has an on-chip temperature sensor, and overvoltage and undervoltage fault clamps, for monitoring and reporting the device temperature, and any output pin voltage faults that may occur during operation.For more information on the ADATE324, contact ADATE324@analog.com.APPLICATIONS ATE Semiconductor and board test systems Instrumentation and characterization equipment