IC Operational Amplifier DUAL CMOS SOP 8PIN PLASTIC

Zero Drift, Single-Supply, R/R, Input/Output Operational Amplifier Features: Lowest auto-zero amplifier noise Low offset voltage: 1 μV Input offset drift: 0.002 μV/°C Rail-to-rail input and output swing 5 V single-supply operation High gain, CMRR, and PSRR: 130 dB Very low input bias current: 100 pA maximum Low supply current: 1.0 mA Overload recovery time: 50 μs No external components required Qualified for automotive applicationsAD8629-EP supports defense and aerospace applications (AQEC standard) Download AD8629-EP Data Sheet (pdf) Extended temperature range: −55°C to +125°C Controlled manufacturing baseline One assembly/test site One fabrication site Enhanced product change notification Qualification data available on request V62/15607 DSCC Drawing Number

Dual 8-Bit, High Bandwidth Multiplying DACs with Parallel Interface Features: 10 MHz Multiplying Bandwidth INL of ±0.25 LSB @ 8 bits 20-lead TSSOP package 2.5 V to 5.5 V supply operation ±10 V reference input 21.3 MSPS update rate Extended temperature range: −40°C to +125°C 4-quadrant multiplication Power-on reset 0.5 μA typical current consumption Guaranteed monotonic Readback Function AD7528 Upgrade (AD5428) AD7547 Upgrade (AD5447)

Dual 10-Bit, High Bandwidth Multiplying DACs with Parallel Interface Features: 10 MHz multiplying bandwidth INL of ±0.25 LSB @ 8 bits 24-lead TSSOP package 2.5 V to 5.5 V supply operation ±10 V reference input 21.3 MSPS update rate Extended temperature range: −40°C to +125°C 4-quadrant multiplication Power-on reset 0.5 μA typical current consumption Guaranteed monotonic Readback Function AD7528 Upgrade (AD5428)  AD7547 Upgrade (AD5447)

12-Bit High Bandwidth Multiplying DAC's with Serial Interface Features: 2.5 V to 5.5 V supply operation 50 MHz Serial Interface 10 MHz Multiplying Bandwidth 2.5 MSPS update rate INL of ±1 LSB for 12-bit DAC ±10 V reference input Low glitch energy < 2 nV-s Extended temperature range −40°C to +125°C 10-lead MSOP package Pin Compatible 8- (AD5426) and 10- (AD5432) Current Output DACs Guaranteed monotonic 4-quadrant multiplication Power-on reset with brownout detection Daisy-chain mode Readback function 0.4 μA typical power consumption

Hot Swap Controller and I2C Power Monitor Features: Allows safe board insertion and removal from a live backplane  Controls supply voltages from 3.15 V to 16.5 V  Precision current sense amplifier  Precision voltage input  12-bit ADC for current and voltage readback  Charge pumped gate drive for external N-channel FET  I2C fast mode-compliant interface (400 kHz maximum) Adjustable analog current limit with circuit breaker  ±3% accurate hot swap current limit level  Fast response limits peak fault current  Automatic retry or latch-off on current fault  Programmable hot swap timing via TIMER pin  Active-high ON pin  2 address pins allow 16 devices on the same bus 10-lead MSOP

Hot-Swappable Dual I2C Isolators, 5 kV Features: Bidirectional I2C communication Open-drain interfaces Suitable for hot swap applications 30 mA current sink capability 1000 KHz operation 3.0 V to 5.5 V supply/logic levels 16-lead SOIC wide body package version (RW-16) High temperature operation: 105°C 16-lead SOIC wide body enhanced creepage version (RI-16-2 Safety and regulatory approvals UL recognition: 5000 V rms for 1 minute per UL 1577 5000 V rms for 1 minute per UL 1577 CSA Component Acceptance Notice 5A (RI-16-2 package)

Quad-Channel, Digital Isolator, Enhanced System-Level ESD Reliability Features: For AEC-Q100 Automotive Qualified Devices Specifications view ADuM340xW data sheet Enhanced system-level ESD performance per IEC 61000-4-x Bidirectional communication 3 V/5 V level translation High temperature operation: 105°C High data rate: dc to 90 Mbps (NRZ) See data sheet for additional featuresADuM3402-EP supports defense and aerospace applications (AQEC standard) Download ADuM3402-EP data sheet (pdf) Military temperature range (−55°C to +125°C) Controlled manufacturing baseline One assembly/test site One fabrication site Enhanced product change notification Qualification data available on request V62/14631 DSCC Drawing Number

The ADPD105/ADPD106/ADPD107 are highly efficient,photometric front ends, each with an integrated 14-bit analog-to-digitalconverter (ADC) and a 20-bit burst accumulator thatworks with flexible light emitting diode (LED) drivers. Theaccumulator is designed to stimulate an LED and measurethe corresponding optical return signal. The data output andfunctional configuration occur over a 1.8 V I2C interface on theADPD105 or SPI on the ADPD106 and ADPD107. The controlcircuitry includes flexible LED signaling and synchronousdetection.The analog front end (AFE) features best-in-class rejection of signaloffset and corruption due to modulated interference commonlycaused by ambient light.Couple the ADPD105/ADPD106/ADPD107 with a lowcapacitance photodiode of <100 pF for optimal performance.The ADPD105/ADPD106/ADPD107 can be used with any LED.The ADPD105 is available in a 2.46 mm ? 1.4 mm WLCSP and a4 mm ? 4 mm LFCSP. The SPI only versions, ADPD106 andADPD107, are available in a 2.46 mm ? 1.4 mm WLCSP.Applications Wearable health and fitness monitors Clinical measurements, for example, SpO2 Industrial monitoring Background light measurements

The AD7961 is a 16-bit, 5 MSPS charge redistribution successive approximation (SAR), analog-to-digital converter (ADC). The SAR architecture allows unmatched performance both in noiseand in linearity. The AD7961 contains a low power, high speed, 16-bit sampling ADC, an internal conversion clock and an internal reference buffer. On the CNV edge, the AD7961samples the voltage difference between the IN+ and IN? pins. The voltages on these pins swing in opposite phase between 0 V and 4.096 V/5 V. The reference voltage is applied to the partexternally. All conversion results are available on a single LVDS self-clocked or echo-clocked serial interface.The AD7961 is available in a 32-lead LFCSP (QFN) with operation specified from ?40?C to +85?C.APPLICATIONS Digital imaging systems ?Digital X-rays ?Computed tomography ?IR cameras MRI gradient control High speed data acquisition Spectroscopy Test equipment